EWDTS 2010 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The main target of the IEEE East-West Design & Test Symposium (EWDTS) is to exchange experiences between scientists and technologies of Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic circuits and systems. The symposium is typically held in countries around the Black Sea, the Baltic Sea and Central Asia region. We cordially invite you to participate and submit your contributions to EWDTS’10 which covers (but is not limited to) the following topics:

Analog, Mixed-Signal and RF Test
Analysis and Optimization
ATPG and High-Level Test
Built-In Self Test
Debug and Diagnosis
Defect/Fault Tolerance and Reliability
Design for Testability
Design Verification and Validation
EDA Tools for Design and Test
Embedded Software Performance
Failure Analysis, Defect and Fault
FPGA Test
HDL in test and test languages
High-level Synthesis
High-Performance Networks and Systems on a Chip
Low-power Design
Memory and Processor Test
Modeling & Fault Simulation
Network-on-Chip Design & Test

Modeling and Synthesis of Embedded Systems
Object-Oriented System Specification and Design
On-Line Testing
Power Issues in Design & Test
Real Time Embedded Systems
Reliability of Digital Systems
Scan-Based Techniques
Self-Repair and Reconfigurable Architectures
Signal and Information Processing in RF and Communication
System Level Modeling, Simulation & Test Generation
System-in-Package and 3D Design & Test
Using UML for Embedded System Specification
CAD and EDA Tools, Methods and Algorithms
Design and Process Engineering
Logic, Schematic and System Synthesis
Place and Route
Thermal, Timing and Electrostatic Analysis of SoCs and Systems on Board
Wireless and RFID Systems Synthesis

Venue

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The Symposium will take place in St. Petersburg, Russia, one of the world's most beautiful cities, that has all the ingredients for an unforgettable experience: high art, lavish architecture, an extraordinary history and rich cultural. From the mysterious twilight of the White Nights to world-beating opera and ballet productions on magical winter evenings, St. Petersburg charms and entices in every season. Also St. Petersburg is the city of science and high tech R&D.

Submissions

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Papers submission info: http://www.ewdtest.com/conf

The best papers of the Symposium will be published in IEEE Design & Test of Computers and Radioelectronics and Informatics Journal (ISSN 1563-0064). The Symposium will take place at the premises of St. Petersburg State Electrotechnical University «LETI».

Key Dates

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Submission deadline: June 30th, 2010
Notification of acceptance: August 1st, 2010

Additional Information

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Organizing Committee Address

Prof. Vladimir Hahanov
Design Automation Department
Kharkov National University of Radioelectronics
Lenin ave, 14
Kharkov, 61166
Ukraine
Tel.: +380-57-702-13-26
E-mail: hahanov@kture.kharkov.ua

Committees

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General Chairs
V. Hahanov – Ukraine
Y. Zorian – USA

General Vice-Chairs
V. Kutuzov – Russia
P. Prinetto – Italy

Program Chairs
S. Shoukourian – Armenia
D. Speranskiy – Russia

Program Vice-Chairs
Z. Navabi – Iran
M. Renovell – France

Publicity Chairs
R. Ubar – Estonia
S. Mosin – Russia

Program Committee
E. J. Aas – Norway
J.   Abraham – USA
M. Adamski – Poland
А. Barkalov – Poland
R. Bazylevych – Ukraine
V. Djigan – Russia
A. Drozd – Ukraine
E. Evdokimov – Ukraine
A. Chaterjee – USA
E. Gramatova – Slovakia
A. Ivanov – Canada
M. Karavay – Russia
V. Kharchenko – Ukraine
K. Kuchukjan – Armenia
W. Kuzmicz – Poland
A. Matrosova – Russia
V. Melikyan – Armenia
O. Novak – Czech Republic
Z. Peng – Sweden
A. Petrenko – Ukraine
D. Puzankov - Russia
J.   Raik – Estonia
A. Romankevich – Ukraine
A. Ryjov – Russia
R. Seinauskas – Lithuania
S. Sharshunov – Russia
A. Singh – USA
J.   Skobtsov – Ukraine
V. Tverdokhlebov – Russia
V. Vardanian – Armenia
V. Yarmolik – Byelorussia

Steering Committee
M. Bondarenko – Ukraine
V. Hahanov – Ukraine
R. Ubar – Estonia
Y. Zorian – USA

Organizing Committee
M. Shestopalov – Russia
S. Chumachenko – Ukraine
N. Kulbakova – Ukraine
V. Obrizan – Ukraine
E. Litvinova – Ukraine
O. Guz – Ukraine
S. Shaposhnikov – Russia
A. Korotkov – Russia
G. Brandon – Luxembourg

For more information, visit us on the web at: http://www.ewdtest.com/conf/

The 8th IEEE East-West Design & Test Symposium (EWDTS 2010 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).